日韩黄色av网站免费-男人的天堂亚洲中文在线-亚洲欧美日韩高清一区-日本精品999在线观看

歡迎來到蘇州英飛思科學儀器有限公司網(wǎng)站!
咨詢熱線

18962188051

當前位置:首頁  >  技術文章  >  什么是X射線熒光鍍層涂層測厚法?

什么是X射線熒光鍍層涂層測厚法?

更新時間:2021-08-03      點擊次數(shù):2354

什么是X射線熒光鍍層涂層測厚法?

材料的涂層厚度是一個重要的工藝參數(shù)。它直接影響零件或產(chǎn)品的耐腐蝕性、裝飾效果、導電性、產(chǎn)品可靠性和使用壽命。因此,涂層的厚度在產(chǎn)品質量、工藝控制和成本控制中起著重要作用。


什么是電鍍/涂層?


電鍍是指在一些物品的金屬表面涂上一層有機物,或薄薄的一層金屬或仿制某種貴金屬,為了美觀或存放,在普通金屬表面鍍上這種貴金屬。 .復合鍍層的制備是在鍍液中加入一種或幾種不溶性固體顆粒,使固體顆粒與金屬離子共沉積的過程。它實際上是一種金屬基復合材料。


什么是涂層厚度測試?有哪些方法?


涂層厚度測試檢測材料表面金屬和氧化物涂層的厚度。鍍層厚度的測量方法主要有金相法、X射線熒光法和掃描電子顯微鏡測量法等。


XRF鍍層測厚儀俗稱X射線熒光測厚儀、鍍層測厚儀、薄膜測厚儀、薄膜測厚儀、金鎳測厚儀、電鍍薄膜測厚儀等,主要用于精確測量涂層的厚度。金屬電鍍層。


XRF涂層測厚儀:


俗稱X射線熒光測厚儀、鍍層測厚儀、薄膜測厚儀、薄膜測厚儀、金鎳測厚儀、電鍍薄膜測厚儀等;




功能:精密測量金屬鍍層厚度;



應用范圍:測量涂層、涂層、薄膜、液體的厚度或成分,測量范圍從12(Mg)到92(U)


使用X射線的非接觸式厚度測量裝置可以讓探測器檢測穿透目標物體的量子X射線量,或穿透目標物體的熒光X射線量來測量厚度的目標對象。探測器探測到的量子X射線或熒光X射線的數(shù)量因目標物體的材料而異,其吸收系數(shù)、密度和厚度各不相同。無需比較目標物體的量子 X 射線量和穿過目標物體并從 X 射線目標發(fā)射的 X 射線量。厚度。


校準曲線是通過比較具有基層的參考樣品的基層和由其上形成的薄膜層形成的基層中特定元素散射的信號強度與薄層厚度之間的差異來確定的。通過將具有基層的參考樣品的基層和其上形成有基層的目標樣品的基層中的特定元素散射的信號與校準進行比較來確定目標樣品膜層厚度。


典型的鍍層厚度光譜圖(鐵鍍鎳鍍金)


The coating thickness of the material is an important process parameter. It directly affects the corrosion resistance, decorative effect, electrical conductivity, product reliability and service life of parts or products. Therefore, the thickness of the coating plays an important role in product quality, process control, and cost control.


What is plating/coating?


Plating refers to coating a layer of organic matter, or a thin layer of metal or imitating some kind of precious metal, on the metal surface of some items for good-looking or storage, and plating this precious metal on the surface of ordinary metal. . The preparation of composite coating is a process of adding one or several insoluble solid particles to the plating solution to co-deposit the solid particles and metal ions. It is actually a metal-based composite material.


What is the coating thickness test? What are the methods?


Coating thickness test detects the thickness of metal and oxide coatings on the surface of the material. The measurement methods of coating thickness mainly include metallographic method, X-ray fluorescence method and scanning electron microscope measurement method and so on.


XRF coating thickness gauges are commonly known as X-ray fluorescence thickness gauges, coating thickness gauges, film thickness gauges, film thickness testers, gold-nickel thickness testers, electroplating film thickness gauges, etc. They are mainly used to accurately measure the thickness of metal electroplating layers.


XRF coating thickness gauge:


Commonly known as X-ray fluorescence thickness gauge, coating thickness gauge, film thickness gauge, film thickness tester, gold nickel thickness tester, electroplating film thickness gauge, etc.;


Function: precise measurement of the thickness of the metal plating layer;


Application range: measuring the thickness or composition of coatings, coatings, films, liquids, measuring range from 12 (Mg) to 92 (U)


The non-contact thickness measuring device using X-rays can allow the amount of quantum X-rays penetrating the target object to be detected by the detector, or the amount of fluorescent X-rays penetrating the target object to be detected to measure the thickness of the target object. The amount of quantum X-rays or fluorescent X-rays detected by the detector in response to the material of the target object varies in absorption coefficient, density, and thickness. It is not necessary to compare the amount of quantum X-rays of the target object and the amount of X-rays irradiated to pass through the target object and emitted from the X-ray target. thickness.


The calibration curve is determined by comparing the difference between the intensity of the signal scattered by the specific element in the base layer of the reference sample having the base layer and the base layer formed by the thin film layer formed thereon with the thickness of the thin film layer, and The target is determined by comparing the intensity difference between the signal scattered by a specific element in the base layer of the reference sample having the base layer and the base layer of the target sample having the base layer formed thereon with the calibration curve. The thickness of the film layer of the sample


蘇州英飛思科學儀器有限公司
  • 聯(lián)系人:張經(jīng)理
  • 地址:江蘇省蘇州工業(yè)園區(qū)唯新路69號一能科技園2幢407
  • 郵箱:sales@esi-xrf.com
  • 傳真:
關注我們

歡迎您加我微信了解更多信息

掃一掃
聯(lián)系我們
版權所有©2024蘇州英飛思科學儀器有限公司All Rights Reserved    備案號:蘇ICP備2021018034號-2    sitemap.xml    總流量:165336
管理登陸    技術支持:化工儀器網(wǎng)    
日本免费一区二区在线视频| 成年人免费在线不卡视频| 国产欧美日韩一级二级三级| 成人精品颜射少妇内射| 国产成人精品一区二区国产乱码| 久久亚洲国产成人精品性色| 高潮少妇高潮少妇av| 国产欧美高清在线观看视频| 亚洲精品天堂av免费看| 国产精品久久中文字幕亚洲| 亚洲一区二区三区香蕉不卡| 中文人妻熟妇乱又伦精品| 欧美日韩激情在线不卡三区| 欧美日韩国产激情高清| 久久精品国产亚洲av久| 少妇38p高潮在线| 国产精品综合日韩精| 亚洲欧美日韩在线观看a三区 | 午夜未满十八禁止观看| 国产一区二区三区高潮爽| 国产三级三级三级免费看| 久久激情日本人妻av免费| 国产97精品在线播放| 2020中文字字幕在线不卡| 日日夜夜久久国产精品| 日韩高清在线亚洲专区不卡| 午夜福利中文在线观看| 国产成人午夜视频免费一区| 日韩精品在线观看一二三区| 日本精品一级免费在线| 国偷蜜桃av一区二区三区| 黑丝美女国产精品久久久| 欧美特黄高清在线观看| 国产区精品福利在线熟女| 久久夜色噜噜噜av一区| 日本一区二区三区三州免费观看 | 亚洲国内精品一区二区在线| 欧美成人精品在线观看| 免费观看国产裸体视频| 亚洲中文有码一区二区| 91香蕉伊人综合久久麻豆|